The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Mar. 04, 2020
China Triumph International Engineering Co., Ltd., Shanghai, CN;
Ctf Solar Gmbh, Dresden, DE;
Shou Peng, Shanghai, CN;
Xinjian Yin, Shanghai, CN;
Ganhua Fu, Leipzig, DE;
Zhizhong Liao, Dresden, DE;
Marcel Mischke, Dresden, DE;
Michael Harr, Ruppertshain, DE;
Bastian Siepchen, Dresden, DE;
CHINA TRIUMPH INTERNATIONAL ENGINEERING CO., LTD., Shanghai, CN;
CTF SOLAR GMBH, Dresden, DE;
Abstract
The subject of this invention is a method for testing the data and control interface of individual machines intended for interconnection in an inline system for solar cell production. Furthermore, an Interface-Tester suitable for executing the testing method is disclosed. The method for testing comprises the steps of feeding a dummy workpiece to the tested machine and connecting the interface tester to the standard interface of the machine. Consecutively the interface tester sends controlling signals to the machine and receives the signals from the tested machine. The received signals are compared to reference signals and evaluated. The interface tester comprises a standard interface for coupling the machines in an inline system for solar cell production. Furthermore, the interface tester is equipped with at least one CPU, a volatile and/or non-volatile memory, communication modules, couplers and connectors and at least one human-machine interface.