The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Feb. 08, 2021
Applicant:

Ionpath, Inc., Menlo Park, CA (US);

Inventors:

Harris Fienberg, Redwood City, CA (US);

David Stumbo, Pleasanton, CA (US);

Michael Angelo, Menlo Park, CA (US);

Rachel Finck, Menlo Park, CA (US);

Assignee:

IONpath, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); G01N 33/68 (2006.01); H01J 49/06 (2006.01); G01N 33/58 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0068 (2013.01); G01N 33/58 (2013.01); G01N 33/6848 (2013.01); H01J 49/00 (2013.01); H01J 49/0004 (2013.01); H01J 49/067 (2013.01);
Abstract

The disclosure features systems and methods that include: exposing a biological sample to an ion beam that is incident on the sample at a first angle to a plane of the sample by translating a position of the ion beam on the sample in a first direction relative to a projection of a direction of incidence of the ion beam on the sample; after each translation of the ion beam in the first direction, adjusting a focal length of an ion source that generates the ion beam; and measuring and analyzing secondary ions generated from the sample by the ion beam after adjustment of the focal length to determine mass spectral information for the sample, where the sample is labeled with one or more mass tags and the mass spectral information includes populations of the mass tags at locations of the sample.


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