The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Jan. 30, 2020
Applicant:
Leica Mikrosysteme Gmbh, Vienna, AT;
Inventor:
Peer Oliver Kellermann, Vienna, AT;
Assignee:
Leica Mikrosysteme GmbH, Vienna, AT;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/22 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/222 (2013.01); H01J 37/28 (2013.01); H01J 2237/2802 (2013.01);
Abstract
The present invention concerns a method and a system for imaging at least a part of a specimen by means of two microscopy imaging methods, where a surface () of the specimen () is imaged by means of a first microscopy imaging method, where a replica () of the surface () to be imaged by means of the first microscopy imaging method is produced and this replica () is simultaneously imaged by means of a second microscopy imaging method, where the images produced by means of the first and the second microscopy imaging methods are overlaid at the correct scale.