The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Oct. 17, 2022
Applicant:
Eygs Llp, London, GB;
Inventors:
Mehrdad Jabbarzadeh Gangeh, Mountain View, CA (US);
Hamid Reza Motahari Nezad, Los Altos, CA (US);
Assignee:
EYGS LLP, London, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/40 (2020.01); G06V 30/12 (2022.01); G06V 30/19 (2022.01);
U.S. Cl.
CPC ...
G06V 30/133 (2022.01); G06F 40/40 (2020.01); G06V 30/19147 (2022.01);
Abstract
Methods and apparatus for end-to-end document image quality assessment without having ground truth for characters. An image quality assessment device integrates end-to-end machine learning without using ground truth to automatically predict an overall quality scores for images of documents. The image quality assessment device augments the size of individual image patches extracted from the images based on the contents and size of the images to maintain sufficient size of training data without compromising the reliability of the predicted scores for the images.