The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Sep. 22, 2020
Applicant:
Sentera, Inc., Minneapolis, MN (US);
Inventor:
Gregory Emerick, Minneapolis, MN (US);
Assignee:
Sentera, Inc., St. Paul, MN (US);
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/10 (2022.01); G06T 3/40 (2006.01); B64C 39/02 (2023.01); B64U 10/13 (2023.01); B64U 101/30 (2023.01);
U.S. Cl.
CPC ...
G06V 20/188 (2022.01); B64C 39/024 (2013.01); G06T 3/4038 (2013.01); B64U 10/13 (2023.01); B64U 2101/30 (2023.01);
Abstract
One or more images are used to analyze permanent cropland. The images can be obtained from one or more sensors on an aerial vehicle including, but not limited to, UAVs. The analysis of the permanent cropland includes, but is not limited to, analyzing the plants growing in the permanent cropland or analyzing the permanent crops growing on the plants. In one embodiment, the analysis can include estimating a total yield of the permanent crops where the estimated permanent crop yield is more accurate than the estimated yield obtained using traditional methods.