The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Dec. 09, 2020
Beijing Baidu Netcom Science and Technology Co., Ltd., Beijing, CN;
Shufei Lin, Beijing, CN;
Jianfeng Zhu, Beijing, CN;
Pengcheng Yuan, Beijing, CN;
Bin Zhang, Beijing, CN;
Shumin Han, Beijing, CN;
Yingbo Xu, Beijing, CN;
Yuan Feng, Beijing, CN;
Ying Xin, Beijing, CN;
Xiaodi Wang, Beijing, CN;
Jingwei Liu, Beijing, CN;
Shilei Wen, Beijing, CN;
Hongwu Zhang, Beijing, CN;
Errui Ding, Beijing, CN;
BEIJING BAIDU NETCOM SCIENCE AND TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
A method for detecting a surface defect, a method for training model, an apparatus, a device, and a medium, are provided. The method includes: inputting a surface image of the article for detection into a defect detection model to perform a defect detection, and acquiring a defect detection result output by the defect detection model; inputting a surface image of a defective article determined to be defective into an image discrimination model based on the defect detection result to determine whether the surface image of the defective article is defective, wherein the image discrimination model is a trained generative adversarial networks model, and the generative adversarial networks model is obtained by training using a surface image of a defect-free good article; and adjusting the defect detection result of the surface image of the defective article according to a determination result of the image discrimination model.