The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Jul. 05, 2022
Kettering University, Flint, MI (US);
Javad Baqersad, Flint, MI (US);
KETTERING UNIVERSITY, Flint, MI (US);
Abstract
A system for measuring total operating deflection shapes of a structure includes one or more imagers, each including two cameras spaced apart from one another and each oriented and positioned to have corresponding fields of view of a different corresponding section of the structure, with the corresponding sections that may include overlap area of the structure within each of the different sections of the structure. Each of the cameras generates a corresponding data stream, which is communicated to a controller, which is configured to measure the response of the structure to an excitation, such as a vibration or an impulse. The system is configured to convert time-domain data from each of the data streams to the frequency-domain data using a Fourier Transform algorithm and stitching the shapes to obtain the total operating deflection shapes of the structure by scaling and stitching together the frequency-domain data.