The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Nov. 30, 2021
Bank of America Corporation, Charlotte, NC (US);
Robert E. Mills, Jr., Stockbridge, GA (US);
Murali Santhanam, Naperville, IL (US);
Kerry Kurt Simpkins, Fort Mill, SC (US);
John B. Hall, Charlotte, NC (US);
Michael J. Pepe, Jr., Wilmington, DE (US);
Jasher David Fowles, Davidson, NC (US);
Jeanne Moulton, Concord, NC (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
Systems for image evaluation and dynamic cropping are provided. In some examples, a system, may receive an instrument or image of an instrument. Identifying information may be extracted from the instrument or image of the instrument. Based on the extracted identifying information, a check/check image profile may be retrieved. In some examples, expected size and/or shape data may be extracted from the check/check image profile. The extracted expected size and/or shape data may be compared to size and/or shape data from the received instrument or image of the instrument to identify any anomalies (e.g., to determine whether the expected size and/or shape data matches the size and/or shape data of the received instrument or image of the instrument. If the expected size and/or shape data does not match size and/or shape data from the received instrument or image of the instrument, the instrument or image of the instrument may be programmatically modified and a modified image of the instrument may be generated.