The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Dec. 22, 2020
Takuji Kamada, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Yoichi Kubota, Tokyo, JP;
Yuka Minamizono, Bellevue, WA (US);
Takuji Kamada, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Yoichi Kubota, Tokyo, JP;
Yuka Minamizono, Bellevue, WA (US);
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
An inspection system includes circuitry configured to determine whether a predetermined pattern is present in a master image of an inspection target object; acquire an inspection target image of the inspection target object from an image captured by an image capturing device; compare the master image of the inspection target object with the inspection target image, to inspect the inspection target object; and switch a threshold value used in comparing the master image with the inspection target image of the inspection target object depending on a determination result of determining whether the predetermined pattern is present in the master image of the inspection target object.