The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Dec. 09, 2022
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Marcus Dyba, Wetzlar, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An image processing system, includes a processor, wherein the processor is configured to obtain image pixel data generated by an optical imaging system of a microscope, to perform deconvolution processing on the obtained image pixel data for generating deconvolved image pixel data, to perform denoising processing on the obtained image pixel data for generating denoised image pixel data, to obtain a sampling density based on which the image pixel data is generated by the optical imaging system, and to mix the deconvolved image pixel data and the denoised image pixel data for generating mixed image pixel data with a weighting dependent on the sampling density to change a ratio of the deconvolved image pixel data in relation to the denoised image pixel data when the sampling density exceeds an oversampling limit.