The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Feb. 24, 2022
Applicant:

Xi'an University of Posts & Telecommunications, Xi'an, CN;

Inventors:

Weihua Liu, Xi'an, CN;

Biyan Ma, Xi'an, CN;

Ying Liu, Xi'an, CN;

Yanchao Gong, Xi'an, CN;

Fuping Wang, Xi'an, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 5/009 (2013.01); G06T 5/50 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20221 (2013.01);
Abstract

The present disclosure provides a multi-exposure image fusion (MEF) method based on a feature distribution weight of a multi-exposure image, including: performing color space transformation (CST) on an image, determining a luminance distribution weight of the image, determining an exposure distribution weight of the image, determining a local gradient weight of the image, determining a final weight, and determining a fused image. The present disclosure combines the luminance distribution weight of the image, the exposure distribution weight of the image and the local gradient weight of the image to obtain the final weight, and fuses the input image and the weight with the existing pyramid-based multi-resolution fusion method to obtain the fused image, thereby solving the technical problem that an existing MEF method does not consider the overall feature distribution of the multi-exposure image.


Find Patent Forward Citations

Liu, Weihua. (2023). Multi-exposure image fusion method based on feature distribution weight of multi-exposure image (U.S. Patent No. 11763432). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11763432

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