The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Jan. 07, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Chihsin Wu, San Jose, CA (US);

David R. Pope, Campbell, CA (US);

Sheng Lin, San Jose, CA (US);

Amnon D. Silverstein, Palo Alto, CA (US);

Assignee:

APPLE INC., Cupertino, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 3/40 (2006.01); H04N 23/88 (2023.01);
U.S. Cl.
CPC ...
G06T 3/4007 (2013.01); H04N 23/88 (2023.01);
Abstract

A foveated down sampling and correction (FDS-C) circuit for combined down sampling and correction of chromatic aberrations in images. The FDS-C circuit performs down sampling and interpolation of pixel values of a first subset of pixels of a color in a raw image using down sampling scale factors and first interpolation coefficients to generate first corrected pixel values for pixels of the color in a first corrected version of the raw image. The FDS-C circuit further performs interpolation of pixel values of a second subset of the pixels in the first corrected version using second interpolation coefficients to generate second corrected pixel values for pixels of the color in a second corrected version of the raw image. Pixels in the first subset are arranged in a first direction, pixels in the second subset are arranged in a second direction, and the down sampling scale factors vary along the first direction.


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