The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Sep. 16, 2020
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/0635 (2023.01); G16H 50/30 (2018.01); G06Q 50/26 (2012.01); G06Q 10/0637 (2023.01); G06Q 10/1093 (2023.01); G16H 50/80 (2018.01);
U.S. Cl.
CPC ...
G06Q 10/0635 (2013.01); G06Q 10/0637 (2013.01); G06Q 10/1095 (2013.01); G06Q 50/265 (2013.01); G16H 50/30 (2018.01); G16H 50/80 (2018.01);
Abstract
An event at a location is identified. An event risk of the event can be calculated based on risk characteristics of both the location of the event ('location risk characteristics') and the event itself ('personnel risk characteristics'). Location risk characteristics can include a visitor history of the location. Personnel risk characteristics can be based on attendees of the event, such as a number of attendees. The overall event risk, once calculated, can be compared to a threshold. Depending on the comparison, a risk mitigation policy can be implemented.