The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Mar. 25, 2020
International Business Machines Corporation, Armonk, NY (US);
Sattwati Kundu, Bangalore, IN;
Nair Raghunath Eledath, Bangalore, IN;
Mansoor Ahmed, Bangalore, IN;
Geetha Adinarayan, Bangalore, IN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods, systems and computer readable media are provided for configuring machine learning systems to automatically and dynamically select a machine learning model based on statistical profiling of received data to improve machine learning applications for high variance data. Data is received from a system in operation. A profile is computed for the received data. A database comprising a plurality of stored profiles for a dataset is accessed, wherein each stored profile corresponds to a distinct pattern identified in the dataset. The computed profile is compared to each of the stored profiles to determine whether the computed profile matches one or more of the stored profiles. When one or more stored profiles match the computed profile, a matching profile is selected by the machine learning system. The received data is processed using a ML model associated with the matching profile.