The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Jul. 07, 2020
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Myung Eun Kim, Daejeon, KR;

Seonghyun Kim, Daejeon, KR;

Hyunseok Kim, Daejeon, KR;

Young Sung Son, Daejeon, KR;

Jongkwon Son, Daejeon, KR;

Soonyong Song, Daejeon, KR;

Donghun Lee, Sejong-si, KR;

Ingook Jang, Gwangmyeong-si, KR;

Jin Chul Choi, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/00 (2023.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

An apparatus and method for abnormal situation detection are disclosed. An abnormal situation detection apparatus can map first sensor data among sensor data transmitted from a plurality of sensors into a vector value, convert it into first situation information in the form of an image pattern, and generate a learning model using the first situation information and an abnormal situation reference range. In addition, the abnormal situation detection apparatus can convert second sensor data among sensor data transmitted from a plurality of sensors into a form that can be input to the learning model, and determine whether an abnormal situation occurs by applying the converted second data to the learning model.


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