The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Dec. 04, 2018
Sap SE, Walldorf, DE;
Lars Erbe, Stutensee, DE;
Andreas Wildhagen, Wiesloch, DE;
Maximilian Stueber, Mannheim, DE;
Andre Pany, Bad Friedrichshall, DE;
Samir Zeort, Waldorf, DE;
Pablo Vicente Albert-Maestro, Trondheim, NO;
SAP SE, Walldorf, DE;
Abstract
Systems and methods for event-triggered analysis for high fidelity simulation. The method may comprise collecting event data produced by one or more event monitors in operational relationship with one or more elements of an event-producing system, wherein at least one of the one or more elements generates a plurality of events. The event data may be clustered into one or more groups, according to one or more event attributes. The event data may be selectively transmittable to one or more subscribers, by way of the one or more subscribers subscribing to one or more channels associated with the one or more groups. A publication mechanism may be implemented to classify the clustered event data into the one or more channels, the event data associated with at least one attribute being classified for transmission over at least one of the one or more channels.