The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Dec. 16, 2020
Landmark Graphics Corporation, Houston, TX (US);
Andrew Davies, West Hagbourne, GB;
Mike Derek Simmons, Wantage, GB;
Michael Charles Quintrell Treloar, Wantage, GB;
James Iain Scotchman, Didcot, GB;
Owen Edward Sutcliffe, Stevenson, GB;
Landmark Graphics Corporation, Houston, TX (US);
Abstract
A system is described for determining an analogue geological feature. The system may include a processor and a non-transitory computer-readable medium comprising instructions that are executable by the processor to cause the processor to perform various operations. The system may generate, by extracting parameter signatures for geological features, a database including parameters about geological features associated with parameter signatures. The system may receive data including parameters and a feature-type about a geological feature of interest. The system may generate a signature including values for a subset of the feature-of-interest parameters selected based on the geological feature of interest for the feature-of-interest using the data. The system may execute a comparison of the feature signature to the parameter signatures included in the database for identifying an analogue geological feature for the feature of interest. The system may output a subset of parameters for the analogue for use in subterranean exploration.