The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Aug. 13, 2021
Avalara, Inc., Seattle, WA (US);
Mark Janzen, Seattle, WA (US);
Aaron Lee Robles, Bainbridge Island, WA (US);
Nikki Nash, Seattle, WA (US);
Rahul Aggarwal, Maharashtra, IN;
Gregory T. Kavounas, Bellevue, WA (US);
Avalara, Inc., Seattle, WA (US);
Abstract
Systems and methods electronically generate sample dots, produce resources associated with the dots and estimate a resource for a target point from known resources of dots near the target point based on client side version of digital rules, cataloged data and coarse values previously received from the online service platform. A client receives cataloged data of a cataloged domain in which the cataloged data includes data representing a plurality of dots and a respective computed resource value for each of the dots and each dot of the plurality of dots represents a point in the cataloged domain. In response to confirming a target point is in the cataloged domain, the system discovers a closest one or more dots to the target point based on the cataloged data, estimates a statistic for a resource for the target point based on the respective computed resource values of the closest one or more dots, stores the estimated statistic in a memory, and produces the local estimate based on the estimated statistic.