The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Nov. 30, 2021
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Mayank Agarwal, Mountain View, CA (US);

Dmitrii Anoshin, Redwood City, CA (US);

Steven Flanders, Nashua, NH (US);

Steven Karis, Redwood City, CA (US);

Justin Smith, San Francisco, CA (US);

Eric Wohlstadter, Atherton, CA (US);

Assignee:

SPLUNK Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 16/953 (2019.01);
U.S. Cl.
CPC ...
G06F 11/364 (2013.01); G06F 16/953 (2019.01);
Abstract

A method of analyzing a performance of a microservices-based application comprises generating a plurality of traces from a plurality of spans associated with the microservices-based application. The method also comprises generating a plurality of data sets each associated with a respective analysis mode of a plurality of analysis modes using the plurality of traces, wherein each analysis mode extracts a different level of detail for analyzing the performance of the services in the application from the plurality of spans. Further, the method comprises selecting, based on a first user query, a first analysis mode from the plurality of analysis modes for generating a response to the first user query. The method also comprises accessing a data set of the plurality of data sets that is associated with the first analysis mode and generating the response to the first user query using the data set associated with the first analysis mode.


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