The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Jan. 14, 2022
Applicant:

Spirent Communications, Inc., San Jose, CA (US);

Inventors:

Douglas Grinkemeyer, Germantown, MD (US);

David Dailey, Boyds, MD (US);

Kevin Myers, Telford, PA (US);

Daniel Abarbanel, Waynesboro, PA (US);

Assignee:

Spirent Communications, Inc., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); H04L 9/40 (2022.01); G06F 9/455 (2018.01); H04L 43/50 (2022.01);
U.S. Cl.
CPC ...
G06F 11/301 (2013.01); G06F 9/45558 (2013.01); H04L 43/50 (2013.01); H04L 63/029 (2013.01); G06F 2009/45587 (2013.01); G06F 2009/45595 (2013.01);
Abstract

A method of a test controller controlling a test platform to run test applications is provided, wherein an authenticated connection exists between the test platform and a phone home service through which secure tunnel information for the test controller has been obtained. The method including the test controller (i) generating an instruction to load and prepare a test application, the instruction including a URL for a repository that stores the test application as a component executable on the test platform, (ii) transmitting the generated instruction to the test platform over an initiated first secure tunnel between the test platform and the test controller, and (iii) controlling the test platform to perform a requested test using the test application using an established second secure tunnel between (a) the test platform or the test application and (b) the test controller.


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