The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Apr. 28, 2022
Splunk Inc., San Francisco, CA (US);
Mayank Agarwal, Kirkland, WA (US);
Steven Flanders, Nashua, NH (US);
Justin Smith, San Francisco, CA (US);
Gergely Danyi, Redwood City, CA (US);
SPLUNK Inc., San Francisco, CA (US);
Abstract
A method of performing error analysis in a system comprising microservices comprises identifying a root cause error span from among a plurality of error spans for a trace, wherein an error span is a span that returns an error to a microservice that generates the span, and wherein a root cause error span is an error span associated with an error originating microservice. The method further comprises determining a call path associated with the root cause error span, where the call path comprises a chain of spans starting at the root cause error span, and where each subsequent span in the chain is a parent span of a prior span. Subsequently the method comprises mapping each span in the chain to a span error frame to create an error stack and rendering an image of the error stack.