The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

May. 20, 2020
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Teruaki Fukuoka, Tokyo, JP;

Nobuaki Tanaka, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4183 (2013.01); G05B 19/41885 (2013.01);
Abstract

A data generation device includes a large-scale data acquisition unit that obtains large-scale data that is large-scale learning data used in learning of a first determination model for determining a machining state of a workpiece machined by a first machine tool; an adaptive data acquisition unit that obtains adaptive data for use in generation of learning data for use in learning of a second determination model for determining a machining state of a workpiece machined by a second machine tool; and a learning data generation unit that converts the large-scale data based on the adaptive data to generate adapted large-scale data for use in learning of the second determination model.


Find Patent Forward Citations

Fukuoka, Teruaki. (2023). Data generation device, machine learning system, and machining state estimation system (U.S. Patent No. 11762374). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11762374

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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