The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Aug. 09, 2022
Argo Ai, Llc, Pittsburgh, PA (US);
Joshua S. Smith, Livonia, MI (US);
Brian T. Margosian, Lathrup Village, MI (US);
Kevin J. Nealis, Yardley, PA (US);
Ryan J. Skaff, Farmington Hills, MI (US);
Kenneth John Jackson, Dearborn, MI (US);
ARGO AI, LLC, Pittsburgh, PA (US);
Abstract
Systems, methods, and computer-readable media are disclosed for a systems and methods for improved LIDAR return light capture efficiency. One example method may include comparing, by a controller including a processor and at a first time, a first temperature of a first computing element to a first threshold temperature and a second temperature of a second computing element to a second threshold temperature. The example method may also include sending, based on a determination that the first temperature is below the first threshold temperature and the second temperature is above the second threshold temperature, a first signal to a switch to activate a data output corresponding to the second computing element. The example method may also include sending, to the second computing element, a second signal to cause a third computing element to increase heat dissipation from the third computing element to the first computing element. The example method may also include receiving, from the first computing element, a third temperature of the first computing element at a second time. The example method may also include comparing the third temperature of the first computing element to the first threshold temperature. The example method may also include determining that the third temperature of the first computing element is at or above the first threshold temperature at the second time. The example method may also include sending, based on a determination that that the third temperature is at or above the first threshold temperature, a third signal to the switch to activate a data output corresponding to the first computing element.