The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Feb. 25, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Takahiro Toku, Kusatsu, JP;

Yuki Ueyama, Kyoto, JP;

Shuji Inamoto, Kyoto, JP;

Yasuaki Abe, Takatsuki, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G05B 13/02 (2006.01);
U.S. Cl.
CPC ...
G05B 13/041 (2013.01); G05B 13/0265 (2013.01); G05B 13/048 (2013.01);
Abstract

The present invention reduces the probability of malfunction occurrence when performing predictive control of a device being controlled. In this control device of one aspect of the present invention, a prediction model for a control variable is used to calculate a prediction value from a measured value of the control variable, and a desired command value of the control variable is determined by correcting a desired basic value in accordance with the calculated prediction value. The degree of correction is determined on the basis of weight. The control device controls the operation of the device being controlled according to the determined desired command value. The control device assesses whether the device being controlled is operated appropriately on the basis of monitoring data relating to the operation result of the device being controlled, and optimizes the weight of the correction to make appropriate control possible based on the assessment result.


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