The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Aug. 06, 2020
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

Siyoung Choi, Daejeon, KR;

Jinwon Park, Daejeon, KR;

Jaehong Lee, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/02 (2006.01); G01N 25/04 (2006.01);
U.S. Cl.
CPC ...
G01N 25/04 (2013.01);
Abstract

Provided are a method of and a device for measuring a glass transition temperature and a degree of crystallinity of a polymer. According to the measurement method and the device of one exemplary embodiment of the present invention, a glass transition temperature and a degree of crystallinity may be measured easily, rapidly, and accurately in a field other than a laboratory, and fast and accurate conversion is possible for various measurement conditions such as temperature, frequency, etc.


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