The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Mar. 04, 2022
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventor:
Shuhei Onishi, Kyoto, JP;
Assignee:
Shimadzu Corporation, Kyoto, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/046 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/046 (2013.01); G01N 23/083 (2013.01); G01N 2223/04 (2013.01); G01N 2223/3035 (2013.01); G01N 2223/419 (2013.01);
Abstract
A CT-device evaluation phantom to be placed between a light source for emitting a probe light and a two-dimensional detector when in use, including a ring-shaped supporting base and three or more absorbing objects whose transmittance to the probe light is equal to or lower than that of the supporting base. The CT-device evaluation phantom has a sufficient level of mechanical strength regardless of its size, and is also easy to create.
Onishi, Shuhei. (2023). Phantom for evaluating ct device (U.S. Patent No. 11761911). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11761911
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile