The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Dec. 08, 2022
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventors:

Qiushu Chen, San Jose, CA (US);

Peter Kiesel, Palo Alto, CA (US);

Jacob N. Chamoun, San Mateo, CA (US);

Norman Nan Shi, Palo Alto, CA (US);

Noble M. Johnson, Menlo Park, CA (US);

Assignee:

XEROX CORPORATION, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01);
U.S. Cl.
CPC ...
G01N 21/645 (2013.01); G01N 21/6445 (2013.01); G01N 21/6486 (2013.01); G01N 2021/6463 (2013.01);
Abstract

An analyzing system includes a detection area with a transparent window past which an analyte moves and emits or transmits light. One or more polarizing elements receive and polarize the light into respective two or more different polarization components. One or more optical detectors receive the respective two or more polarization components and generate respective at least two signals in response. A processor is coupled to the optical detectors and configured to determine a polarization status of the light from the analyte based on the at least two signals.


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