The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Apr. 16, 2021
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Stefan Christ, Schoeffengrund, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A system for microscopic examination of a sample has a microscope and an incubation environment conditioning unit connected to the microscope. The microscope has a microscope housing enclosing an illumination optics, a microscope stage and an imaging optics, an integrated sample chamber located within the microscope housing and formed by a separated housing section within the microscope housing. The housing section has a microscope interface for connecting the incubation environment conditioning unit to the sample chamber and/or to a stage top chamber for placing within the sample chamber and for receiving the sample. The system provides a first and a second incubation modes. In the first incubation mode the sample chamber is incubated by supply of a first incubation atmosphere by the incubation environment conditioning unit. In the second incubation mode the stage top chamber is incubated by supply of a second incubation atmosphere by the incubation environment conditioning unit.