The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Mar. 17, 2021
Seiko Epson Corporation, Toyko, JP;
Yoshihiro Kobayashi, Komagane, JP;
Abstract
A measurement method includes: a step of acquiring first observation point information including a time point when each part of a moving object passes a first observation point and a physical quantity which is a response to an action; a step of acquiring second observation point information including a time point when the each part passes a second observation point and a physical quantity which is a response to an action; a step of calculating a deflection waveform of a structure generated by the each part; a step of adding the deflection waveforms to calculate a moving object deflection waveform, and calculating a path deflection waveform based on the moving object deflection waveform; a step of calculating a displacement waveform by twice integrating an acceleration of a third observation point; and a step of calculating, based on the path deflection waveform, a value of each coefficient of a polynomial approximating an integration error, and correcting the displacement waveform based on the value of each coefficient.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile