The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Mar. 17, 2021
Seiko Epson Corporation, Toyko, JP;
Yoshihiro Kobayashi, Komagane, JP;
Abstract
A measurement method includes: a step of acquiring, based on observation information obtained by an observation device, first observation point information including a time point when each of a plurality of parts of a moving object passes a first observation point of a structure and a physical quantity which is a response to an action of each of the plurality of parts on the first observation point; a step of acquiring, based on the observation information, second observation point information including a time point when each of the plurality of parts passes a second observation point and a physical quantity which is a response to an action of each of the plurality of parts on the second observation point; a step of calculating, based on the first observation point information, the second observation point information, a predetermined coefficient, and an approximate expression of deflection of the structure, a deflection waveform of the structure generated by each of the plurality of parts; and a step of calculating a deflection waveform of the structure generated by the moving object by adding the deflection waveform of the structure generated by each of the plurality of parts.