The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Sep. 26, 2018
Applicant:

Toray Industries, Inc., Tokyo, JP;

Inventors:

Yoshihiro Masuda, Otsu, JP;

Shigeru Aoyama, Otsu, JP;

Jun Sakamoto, Shizuoka, JP;

Hiroji Kojima, Shizuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 27/36 (2006.01); B32B 7/023 (2019.01); B32B 7/08 (2019.01); G02B 5/28 (2006.01); G02B 5/26 (2006.01);
U.S. Cl.
CPC ...
B32B 27/36 (2013.01); B32B 7/023 (2019.01); B32B 7/08 (2013.01); B32B 2250/05 (2013.01); B32B 2250/244 (2013.01); B32B 2250/42 (2013.01); B32B 2307/40 (2013.01); B32B 2307/412 (2013.01); B32B 2307/416 (2013.01); B32B 2307/418 (2013.01); B32B 2307/42 (2013.01); B32B 2307/51 (2013.01); B32B 2307/536 (2013.01); B32B 2307/584 (2013.01); B32B 2367/00 (2013.01); B32B 2457/00 (2013.01); B32B 2551/08 (2013.01); G02B 5/26 (2013.01); G02B 5/28 (2013.01); G02B 5/287 (2013.01);
Abstract

A multilayer film having a multi-layer structure unit which is a 51-layered or more multiple layer formed by alternately layering a layer (A layer) a main component of which is a polyester resin (resin A) having a dicarboxylic component and a diol component, and a layer (B layer) a main component of which is a thermoplastic resin (resin B) different from the resin A in optical properties; wherein at least one surface of the multi-layer structure unit has a refractive index of 1.68 or more and 1.80 or less, wherein the surface has a critical load of 15 mN or less at 100° C. in a scratch test, and wherein the multilayer film has at least one reflection bandwidth having a reflectance of 30% or more continuous over a wavelength width of 20 nm or more in a profile of reflectance measured on at least one surface side of the multi-layer structure unit.


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