The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2023
Filed:
Nov. 18, 2020
Bwxt Advanced Technologies Llc, Lynchburg, VA (US);
Ryan Scott Kitchen, Knoxville, TN (US);
Benjamin D. Fisher, Lynchburg, VA (US);
BWXT Advanced Technologies LLC, Lynchburg, VA (US);
Abstract
Methods to in-situ monitor production of additive manufacturing products collects images from the deposition process on a layer-by-layer basis, including a void image of the pattern left in a slurry layer after deposition of a layer and a displacement image formed by immersing the just-deposited layer in a renewed slurry layer. Image properties of the void image and displacement image are corrected and then compared to a binary expected image from a computer generated model to identify defects in the just-deposited layer on a layer-by-layer basis. Additional methods use the output from the comparison to form a 3D model corresponding to at least a portion of the additive manufacturing product. Components to control the additive manufacturing operation based on digital model data and to in-situ monitor successive layers for manufacturing defects can be embodied in a computer system or computer-aided machine, such as a computer controlled additive manufacturing machine.