The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2023

Filed:

Jun. 11, 2021
Applicant:

Canon Medical Systems Corporation, Tochigi, JP;

Inventors:

Wenyuan Qi, Vernon Hills, IL (US);

Yujie Lu, Vernon Hills, IL (US);

Ryo Okuda, Tochigi, JP;

Evren Asma, Vernon Hills, IL (US);

Manabu Teshigawara, Tochigi, JP;

Jeffrey Kolthammer, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5282 (2013.01); A61B 6/032 (2013.01); A61B 6/037 (2013.01); A61B 6/5205 (2013.01);
Abstract

The present disclosure is related to removing scatter from a SPECT scan by utilizing a radiative transfer equation (RTE) method. An attenuation map and emission map are acquired for generating scatter sources maps and scatter on detectors using the RTE method. The estimated scatter on detectors can be removed to produce an image of a SPECT scan with less scatter. Both first-order and multiple-order scatter can be estimated and removed. Additionally, scatter caused by multiple tracers can be determined and removed.


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