The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

May. 29, 2020
Applicant:

Arashi Vision Inc., Shenzhen, CN;

Inventors:

Kun Tan, Shenzhen, CN;

Yibin Guo, Shenzhen, CN;

Assignee:

ARASHI VISION INC., Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/73 (2023.01); H04N 23/71 (2023.01);
U.S. Cl.
CPC ...
H04N 23/73 (2023.01); H04N 23/71 (2023.01);
Abstract

Disclosed are a method for determining semi-synchronous exposure parameters and an electronic device. The method in the embodiments of the present invention comprises: acquiring first exposure parameters corresponding to each lens; if it is determined that a preset EV limit value is not satisfied according to the first exposure parameters of each lens and adjacent lenses, respectively calculating exposure control parameters of each lens; calculating second exposure parameters corresponding to each lens according to the exposure control parameters of each lens and the first exposure parameters corresponding to each lens; if it is determined that the preset EV limit value is satisfied according to the second exposure parameters of each lens and adjacent lenses, determining the second exposure parameters corresponding to each lens to be semi-synchronized exposure parameters of each lens.


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