The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Feb. 27, 2020
Applicants:

Nec Corporation, Tokyo, JP;

Tokyo Institute of Technology, Tokyo, JP;

Inventors:

Takashi Shibata, Tokyo, JP;

Masatoshi Okutomi, Tokyo, JP;

Masayuki Tanaka, Tokyo, JP;

Thapanapong Rukkanchanunt, Tokyo, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/246 (2018.01); G06T 7/80 (2017.01); G06V 10/25 (2022.01);
U.S. Cl.
CPC ...
H04N 13/246 (2018.05); G06T 7/85 (2017.01); G06V 10/25 (2022.01);
Abstract

A camera calibration information acquisition device acquires captured images of a camera calibration target from two or more cameras, detects, from each image, a coordinate of a feature point in the image, calculates—an internal parameter for each camera by using the feature point, calculates, for each camera, a magnitude of error in the coordinate of the feature point, calculates a value for an external parameter of the cameras by using the magnitude of the error, the coordinate of the feature point, and an error function set so that a penalty for error in calculating the external parameter decreases as the magnitude of the error in the coordinate of the feature point in the image increases.


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