The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Feb. 06, 2019
The Regents of the University of Michigan, Ann Arbor, MI (US);
Invenio Imaging, Inc., Santa Clara, CA (US);
Daniel Orringer, Ann Arbor, MI (US);
Balaji Pandian, Farmington Hills, MI (US);
Christian Freudiger, San Carlos, CA (US);
Todd Hollon, Ann Arbor, MI (US);
THE REGENTS OF THE UNIVERSITY OF MICHIGAN, Ann Arbor, MI (US);
INVENIO IMAGING, INC., Santa Clara, CA (US);
Abstract
A system is presented for analyzing and interpreting histologic images. The system includes an imaging device and a diagnostic module. The imaging device captures an image of a tissue sample at an optical section of the tissue sample, where the tissue sample has a thickness larger than the optical section. The system may further include an image interpretation subsystem located remotely from the imaging device and configured to receive the images from the imaging device. The diagnostic module is configured to receive the images for the tissue sample from the imaging device and generates a diagnosis for the tissue sample by applying a machine learning algorithm to the images. The diagnostic module may be interface directly with the imaging device or located remotely at the image interpretation subsystem.