The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Nov. 04, 2022
Applicant:

Guangdong University of Technology, Guangzhou, CN;

Inventors:

Ruiwen He, Guangzhou, CN;

Ruisi Li, Guangzhou, CN;

Yuan Jin, Guangzhou, CN;

Yiyu Lin, Guangzhou, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); G06F 18/25 (2023.01); G06F 123/02 (2023.01);
U.S. Cl.
CPC ...
G07C 5/0816 (2013.01); G06F 18/251 (2023.01); G07C 5/0808 (2013.01); G06F 2123/02 (2023.01);
Abstract

A pilot protection method includes: obtaining time-domain signals data of target element at a preset sampling frequency; fusing time-domain signals data of multiple first sampling periods to obtain first time-domain signals combination data; based on a machine learning model, determining whether a fault occurs in target element according to the first time-domain signals combination data; when it is determined that a fault occurs in target element according to the first time-domain signals combination data, based on the machine learning model, determining whether a fault occurs in target element in the second sampling period according to the second time-domain signals combination data. The second sampling period is the sampling period after determining a fault occurs; when it is determined that the same type of fault occurs in target element in multiple consecutive second sampling periods, the pilot protection system is controlled to perform the protection action on the target element.


Find Patent Forward Citations

Loading…