The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Feb. 28, 2022
Applicant:

Hand Held Products, Inc., Charlotte, NC (US);

Inventors:

Edward Hatton, Yarker, CA;

H. Sprague Ackley, Seattle, WA (US);

Assignee:

Hand Held Products, Inc., Charlotte, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 30/168 (2022.01); G06V 30/262 (2022.01); G06V 30/146 (2022.01); G06F 18/22 (2023.01); G06V 30/19 (2022.01); G06V 10/74 (2022.01); G06V 30/10 (2022.01);
U.S. Cl.
CPC ...
G06V 30/168 (2022.01); G06F 18/22 (2023.01); G06V 10/761 (2022.01); G06V 30/1478 (2022.01); G06V 30/19067 (2022.01); G06V 30/274 (2022.01); G06V 30/10 (2022.01);
Abstract

A method for template matching can include iteratively selecting a template set of points to project over a centerline of a candidate symbol; conducting a template matching analysis; assigning a score to each template set; and selecting a template set with a highest assigned score. For example, the score can depend on proximity of the template points to a center and/or boundaries of a principal tracing path of the symbol. Additionally, one or more template sets having a top rank can be selected for a secondary analysis of proximity of the template points to a boundary of a printing of the symbol. The method can further include using the template with the highest score to interpret the candidate symbol.


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