The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Feb. 17, 2021
Applicant:

Samsung Sds Co., Ltd., Seoul, KR;

Inventors:

Seung Ho Shin, Seoul, KR;

Ji Hoon Kim, Seoul, KR;

Se Won Woo, Seoul, KR;

Kyoung Jin Oh, Seoul, KR;

Seong Won Park, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/20 (2022.01); G06N 3/08 (2023.01); G06F 18/211 (2023.01); G06F 18/213 (2023.01); G06F 18/214 (2023.01); G06F 18/23213 (2023.01); G06N 3/044 (2023.01);
U.S. Cl.
CPC ...
G06V 10/255 (2022.01); G06F 18/211 (2023.01); G06F 18/213 (2023.01); G06F 18/2155 (2023.01); G06F 18/23213 (2023.01); G06N 3/044 (2023.01); G06N 3/08 (2013.01);
Abstract

An apparatus of labeling for object detection according to an embodiment of the present disclosure includes an image selector that determines a plurality of labeling target images from among a plurality of unlabeled images, and determines a labeling order of the plurality of labeling target images, a feedback obtainer that obtains label inspection information on the plurality of labeling target images from a user, and a model trainer that learns the label inspection information input from the user by using the labeling target images, obtains a pseudo label for supervised learning based on a learning result using the label inspection information, and re-determines the labeling order of the labeling target images based on the pseudo label.


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