The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
May. 27, 2021
Applicants:
Research & Business Foundation Sungkyunkwan University, Suwon-si, KR;
Samsung Life Public Welfare Foundation, Seoul, KR;
Inventors:
Assignees:
Research & Business Foundation Sungkyunkwan University, Suwon-si, KR;
SAMSUNG LIFE PUBLIC WELFARE FOUNDATION, Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/13 (2017.01); G06T 7/11 (2017.01); G06T 7/40 (2017.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G06T 7/13 (2017.01); A61B 6/032 (2013.01); G06T 7/11 (2017.01); G06T 7/40 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/30061 (2013.01); G06T 2207/30096 (2013.01);
Abstract
Disclosed are an apparatus and a method for lesion analysis based on a marginal feature. The method for lesion analysis based on a marginal feature according to an embodiment of the present disclosure may include receiving image data for a target region, identifying a lesion region from the image data, deriving a marginal feature for a lesion based on intensity information of the identified lesion region, and inferring an attribute associated with the lesion based on the marginal feature.