The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Aug. 16, 2019
Fujifilm Corporation, Tokyo, JP;
Kenta Matsubara, Ashigarakami-gun, JP;
Takashi Wakui, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are a cell image evaluation device, method, and program which are capable of more accurate and high reliable evaluation even though a captured image of each part to be observed within a container deteriorates. The cell image evaluation device includes an image evaluation unit that evaluates a state of a cell included in a captured image obtained by capturing an inside of the container that contains the cell based on the captured image, and a deterioration determination unit that determines whether or not the captured image deteriorates. The image evaluation unit changes an evaluation method of the captured image according to a determination result of the deterioration determination unit.