The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Mar. 29, 2021
Applicant:
Battelle Memorial Institute, Columbus, OH (US);
Inventors:
Anthony George, Columbus, OH (US);
Thomas Kent, Columbus, OH (US);
Blaine Miller, Columbus, OH (US);
Katie Liszewski, Columbus, OH (US);
Russell Gilabert, Columbus, OH (US);
Timothy McDonley, Columbus, OH (US);
Assignee:
BATTELLE MEMORIAL INSTITUTE, Columbus, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/60 (2006.01); G06T 3/40 (2006.01); G01S 17/86 (2020.01); G01S 13/86 (2006.01); G01S 13/89 (2006.01); G01S 17/89 (2020.01); G06T 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 3/4038 (2013.01); G01S 13/865 (2013.01); G01S 13/89 (2013.01); G01S 17/86 (2020.01); G01S 17/89 (2013.01); G06T 3/0068 (2013.01);
Abstract
A multimodal inspection system (MIS) is disclosed herein. The MIS may use one or more modalities to inspect a sample. Some of the modalities include, but are not limited to, Raman, visible (VIS), terahertz (THz) spectroscopy, longwave infrared (LWIR), shortwave infrared (SWIR), laser profilometry (LP), electromagnetic interference (EMI) near field probing, and/or, Millimeter Wave (MMW) radar.