The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Apr. 08, 2021
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Klaus-Dieter Lange, Houston, TX (US);
Mukund Kumar, Karnataka, IN;
Prateek Bhatnagar, Karnataka, IN;
Nalamati Sai Rajesh, Karnataka, IN;
Nishant Rawtani, Karnataka, IN;
Craig Allan Estepp, Houston, TX (US);
Hewlett Packard Enterprise Development LP, Spring, TX (US);
Abstract
Systems and methods are provided for detecting anomalies on multiple layers of a computer system, such as a compute server. For example, the system can detect anomalies from the lower firmware layer up to the upper application layer of the compute server. The system collects train data from the computer system that is under testing. The train data includes features that affect performance metrics, as defined by a selected benchmark. This train data is used in training machine learning (ML) models. The ML models create a train snapshot corresponding to the selected benchmark. Additionally with every new release, a test snapshot can be created corresponding to the selected benchmark or workload. The system can detect an anomaly based on the train snapshot and the test snapshot. Also, the system can recommend tunings for a best set of features based upon data collected over generations of compute server.