The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jan. 29, 2020
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Nghi Nguyen, San Francisco, CA (US);

Jacob Leverich, San Francisco, CA (US);

Adam Oliner, San Francisco, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/01 (2023.01); G06N 20/00 (2019.01); G06F 3/00 (2006.01);
U.S. Cl.
CPC ...
G06N 7/01 (2023.01); G06F 3/00 (2013.01); G06N 20/00 (2019.01);
Abstract

Methods and systems for determining event probabilities and anomalous events are provided. In one implementation, a method includes: receiving source data, where the source data is configured as a plurality of events with associated timestamps; searching the source data, where the searching provides a search result including N events from the plurality of events, where N is an integer greater than one, where each event of the N events includes a plurality of field values, where at least one event of the N events can include one or more categorical field values and one or more numerical field values; and for an event of the N events, determining a probability of occurrence for each field value of the plurality of field values; and using probabilities determined for the plurality of field values, determining a probability of occurrence for the event.


Find Patent Forward Citations

Loading…