The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Oct. 10, 2017
Nokia Technologies Oy, Espoo, FI;
Jiale Cao, Tianjin, CN;
NOKIA TECHNOLOGIES OY, Espoo, ND (US);
Abstract
A method for pattern recognition may be provided, comprising: receiving data; processing the data with a convolutional neural network in order to recognize a pattern in the data, wherein the convolutional neural network comprises at least: a first branch comprising a sequence of first convolutional blocks, a pooling layer being disposed between any two adjacent first convolutional blocks, each first convolutional blocks comprising at least one convolutional layer, and a second branch comprising a sequence of second convolutional blocks, each second convolutional blocks comprising at least one convolutional layer, and wherein processing the data with a convolutional neural network in order to recognize a pattern in the data comprises: a preceding second convolutional block receiving a first feature map formed by combining of a feature map outputted by a preceding first convolutional block and a feature map outputted by a subsequent first convolutional block, processing the first feature map, and outputting a second feature map, and a subsequent second convolutional block receiving a third feature map formed by combining the second feature map and a feature map outputted by a further subsequent first convolutional block, processing the third feature map, and outputting a fourth feature map. A corresponding apparatus and system for pattern recognition, as well as a computer readable medium, are also provided.