The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Oct. 09, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Takayuki Nakatani, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 16/23 (2019.01); G06N 3/08 (2023.01); G06N 3/04 (2023.01);
U.S. Cl.
CPC ...
G06F 16/2365 (2019.01); G06N 3/04 (2013.01); G06N 3/08 (2013.01);
Abstract

A case data set storage unit includes a plurality of case data sets including difference data representing, a variation from measurement data taken at an initial state to measurement data taken at a plurality of points of time for the same sample under the same measurement condition. An aging degradation estimation unit uses these case data sets to output difference data representing an estimate value of a variation from the measurement data taken at the initial state to measurement data taken, by a measurement device, at or after a first elapsed time, based on difference data representing a variation from the measurement data taken at the initial state to measurement data taken at a plurality of points of time that precede the first elapsed time. An aging degradation correction unit corrects the measurement data taken at or after the first elapsed time, based on the output difference data.


Find Patent Forward Citations

Nakatani, Takayuki. (2023). Analysis device, analysis system, and analysis method (U.S. Patent No. 11755561). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11755561

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…