The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Jun. 24, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Surendra Singh, Bengaluru, IN;

Dinesh Gehlot, Bengaluru, IN;

Mallikarjun Shivappa Bidari, Bengaluru, IN;

Raju Udava Siddappa, Bengaluru, IN;

Shashank Vimal, Bengaluru, IN;

Shreya Ganatra, Bengaluru, IN;

Sujay Shankar Gaitonde, Bengaluru, IN;

Tushar Vrind, Bengaluru, IN;

Venkata Raju Indukuri, Bengaluru, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 12/02 (2006.01); G06F 9/30 (2018.01); G06F 9/32 (2018.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 9/3004 (2013.01); G06F 9/321 (2013.01); G06F 12/0238 (2013.01);
Abstract

A method for managing memory leaks in a memory device includes grouping, by a garbage collection system, a plurality of similar memory allocations of the memory device into one or more Unique Fixed Identifiers (UFIs); identifying, by the garbage collection system, one of the one or more UFIs having a highest accumulated memory size and adding each of the plurality of memory allocations in the identified one of the one or more UFIs into a Potential Leak Candidate List (PLCL); identifying, by the garbage collection system, the memory leaks in the memory device by identifying unreferenced memory addresses associated with the plurality of memory allocations in the PLCL; and releasing, by the garbage collection system, the identified unreferenced memory addresses associated with the plurality of memory allocations corresponding to the memory leaks into the memory device.


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