The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Mar. 07, 2019
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

David Mentre, Rennes, FR;

Denis Cousineau, Rennes, FR;

Eric Lavillonniere, Rennes, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 17/11 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3676 (2013.01); G06F 17/11 (2013.01);
Abstract

A method () to generate test suite for a source-code (). The method comprises: a) implementing a structural analysis () of said source-code () to obtain a completed source-code () including: —parsing the source-code, —addition of annotations defining tests objectives, —generation of stubs; b) implementing at least one semantic analysis algorithm including categorizing each set of tests objectives as satisfied, impossible to satisfy or unsatisfied; c) feeding a first list () with satisfied test cases; d) feeding a second list () with test objectives impossible to satisfy, e) implementing at least one mathematical optimization algorithm () on parts corresponding to unsatisfied test objectives; —identifying test cases () that satisfy at least a part of said test objectives, —feeding said first list of set of test cases with them, —categorizing said test objectives as satisfied; f) providing a test suite comprising the two lists.


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