The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2023
Filed:
Mar. 19, 2020
Applicant:
Snyk Limited, London, GB;
Inventors:
Guy Podjarny, London, GB;
Assaf Hefetz, Holon, IL;
Assignee:
SNYK LIMITED, London, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 8/60 (2018.01); G06F 16/245 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 11/366 (2013.01); G06F 8/60 (2013.01); G06F 16/2379 (2019.01); G06F 16/245 (2019.01);
Abstract
Flaws in dependencies of deployed applications are identified. In one embodiment, a list of dependencies used by a deployed application that is deployed on the deployment platform is obtained. Each dependency of the list of dependencies is mapped with a flaws database, wherein the flaws database comprising an indication of known flaws for different dependencies and different versions thereof. Based on such mapping, one or more flaws in the deployed application are determined. The determination is performed externally to the deployment platform and without executing a monitoring process thereon.