The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2023

Filed:

Sep. 02, 2021
Applicant:

Raytheon Company, Waltham, MA (US);

Inventor:

Steven J. Manson, Tucson, AZ (US);

Assignee:

Rattheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/18 (2006.01); G06F 11/16 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/167 (2013.01); G06F 11/1471 (2013.01); G06F 11/187 (2013.01); G06F 2201/82 (2013.01);
Abstract

A method includes identifying multiple apportionments, where each apportionment identifies numbers of bit copies to be stored in at least one memory for at least some bits of a data value. The method also includes, for each apportionment, estimating a numerical error associated with use of the apportionment with a specified function, where the numerical error is estimated by creating errors in bit copies of multiple data values processed using the specified function. The method further includes combining portions of different ones of the apportionments having lower estimated numerical errors to create multiple derived apportionments. The method also includes, for each derived apportionment, estimating a numerical error associated with use of the derived apportionment with the specified function. In addition, the method includes selecting a final apportionment for use with the specified function, where the final apportionment includes or is based on at least one of the derived apportionments.


Find Patent Forward Citations

Manson, Steven. (2023). Identification of optimal bit apportionments for digital functions subject to soft errors (U.S. Patent No. 11755431). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11755431

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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